Tunneling current through paraffin oil measured by using a scanning tunneling microscope.
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چکیده
منابع مشابه
Spatial Repartition of Current Fluctuations in a Scanning Tunneling Microscope
Scanning Tunneling Microscopy (STM) is a technique where the surface topography of a conducting sample is probed by a scanning metallic tip. The tip-to-surface distance is controlled by monitoring the electronic tunneling current between the two metals. The aim of this work is to extend the temporal range of this instrument by characterising the time fluctuations of this current on different su...
متن کاملTunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope.
The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electro...
متن کاملScanning tunneling microscope for magneto-optical imaging
• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website. • The final author version ...
متن کاملReproducible Fabrication of Scanning Tunneling Microscope Tips
Reproducible fabrication of Scanning Tunneling Microscope tips is carried out following an electrochemical procedure widely reported. Tips are made from 0.5 diameter tungsten wire. Controlling fabrication parameters (immersion in the electrochemical solution, current-voltage ranges, duration of the process, among others) we achieve aspect ratios of 0.68 and tip radii of 330 nm in the best case....
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ژورنال
عنوان ژورنال: IEEJ Transactions on Fundamentals and Materials
سال: 1988
ISSN: 0385-4205,1347-5533
DOI: 10.1541/ieejfms1972.108.497